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Your query: Author Sysno = "^cbvk_us_auth m0048015^"
  1. RETRO-CATALOGUING - SHORT RECORD
    Diffraction and imaging techniques in material science. Volume II, Imaging and diffraction techniques / editors, S. Amelinckx, R. Gevers, J. Van Landuyt.    Amsterdam ; New York : North-Holland, 1978 . xvii, s. 457-847 il. . ISBN 0-444-85129-1 - C 217.067/2
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    Lidická20/000

  2. RETRO-CATALOGUING - SHORT RECORD
    Diffraction and imaging techniques in material science. Volume I, Electron microscopy / editors, S. Amelinckx, R. Gevers, J. Van Landuyt.    Amsterdam ; New York : North-Holland, 1978 . xvii, 453 s. il. . ISBN 0-444-85128-3 - C 217.067/1
    Umístění:
    BranchAvailableUnavail. / In-house use onlyLoanedReservedPlace
    Lidická20/000



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